Self-consistent analysis of the contact phenomena in low-mobility semiconductors

Journal of Applied Physics

Volumn 93, Issue 4, 2003, Pages 2059-2064

  Preezant, Yevgeni ^a   Tessler, Nir ^a  

^a TECHNION ISRAEL INSTITUTE OF TECHNOLOGY   (Israel)

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER MOBILITY; CHARGE TRANSFER; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC CHARGE; LIGHT EMITTING DIODES; MATHEMATICAL MODELS; POLYMERS;

LOW-MOBILITY SEMICONDUCTORS;

SEMICONDUCTOR MATERIALS;

EID: 0037443014     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1539534     Document Type: Article

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