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Volumn 203-204, Issue , 2003, Pages 114-117

Investigation of the cluster ion formation process for inorganic compounds in static SIMS

Author keywords

Iron chromite; Lead titanate; Oxide mixtures; ToF SIMS; Transition metal oxides

Indexed keywords

DISSOCIATION; GASES; ION BOMBARDMENT; IONS; OXIDES; SECONDARY ION MASS SPECTROMETRY; STOICHIOMETRY;

EID: 0037437835     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(02)00711-0     Document Type: Conference Paper
Times cited : (11)

References (10)
  • 1
    • 0000881743 scopus 로고    scopus 로고
    • Secondary ion mass spectrometry - The surface mass spectrometry
    • J.C. Vickerman (Ed.), Wiley, Chichester, UK
    • J.C. Vickerman, A.J. Swift, Secondary ion mass spectrometry - the surface mass spectrometry, in: J.C. Vickerman (Ed.), Surface Analysis - The Principal Techniques, Wiley, Chichester, UK, 1997, pp. 135-214.
    • (1997) Surface Analysis - The Principal Techniques , pp. 135-214
    • Vickerman, J.C.1    Swift, A.J.2
  • 9
    • 0002639556 scopus 로고
    • Sputtering of multicomponent materials
    • Behrisch (Ed.), Springer, Berlin
    • G. Betz, G.K. Wehner, Sputtering of multicomponent materials, in: Behrisch (Ed.), Sputtering by Particle Bombardment II, Springer, Berlin, 1983, pp. 11-90.
    • (1983) Sputtering by Particle Bombardment II , pp. 11-90
    • Betz, G.1    Wehner, G.K.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.