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Volumn 90, Issue 6, 2003, Pages
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Using metallic interlayers to stabilize abrupt, epitaxial metal-metal interfaces
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Author keywords
[No Author keywords available]
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Indexed keywords
ALUMINUM;
EPITAXIAL GROWTH;
INTERDIFFUSION (SOLIDS);
IRON;
LOW ENERGY ELECTRON DIFFRACTION;
METALS;
MIXING;
RUTHERFORD BACKSCATTERING SPECTROSCOPY;
CHANNELING TECHNIQUE;
EPITAXIAL METAL-METAL INTERFACES;
METALLIC INTERLAYERS;
THIN METALLIC INTERLAYER;
INTERFACES (MATERIALS);
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EID: 0037435856
PISSN: 00319007
EISSN: None
Source Type: Journal
DOI: None Document Type: Article |
Times cited : (16)
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References (21)
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