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Volumn 244, Issue 2, 2002, Pages 206-210

Effects of a Ti interlayer on formation of β-FeSi2 on Si(0 0 1) substrates

Author keywords

A1. Crystal structure; A1. X ray diffraction; B2. Semiconducting silicon compounds

Indexed keywords

CRYSTAL GROWTH; DIFFUSION; IRON; SEMICONDUCTING SILICON; SUBSTRATES; TITANIUM; X RAY DIFFRACTION;

EID: 0036776652     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0248(02)01605-6     Document Type: Article
Times cited : (7)

References (17)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.