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Volumn 15, Issue 5, 2003, Pages
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Exchange coupling of ferromagnetic films across metallic and semiconducting interlayers
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Author keywords
[No Author keywords available]
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Indexed keywords
CURRENT VOLTAGE CHARACTERISTICS;
ELECTRIC CONDUCTIVITY;
ELECTRON TUNNELING;
LOW ENERGY ELECTRON DIFFRACTION;
METALLIC FILMS;
MOLECULAR BEAM EPITAXY;
MULTILAYERS;
SEMICONDUCTING FILMS;
TRANSMISSION ELECTRON MICROSCOPY;
X RAY SPECTROSCOPY;
EXCHANGE COUPLING;
FERROMAGNETIC FILMS;
NEAR EDGE X RAY ABSORPTION SPECTROSCOPY;
SEMICONDUCTING INTERLAYERS;
FERROMAGNETIC MATERIALS;
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EID: 0037433318
PISSN: 09538984
EISSN: None
Source Type: Journal
DOI: 10.1088/0953-8984/15/5/301 Document Type: Article |
Times cited : (37)
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References (16)
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