Exchange coupling of ferromagnetic films across metallic and semiconducting interlayers

Journal of Physics Condensed Matter

Volumn 15, Issue 5, 2003, Pages

  Burgler D E ^a   Buchmeier, M ^a   Cramm, S ^a   Eisebitt, S ^b   Gareev, R R ^a   Grunberg P ^a   Jia, C L ^a   Pohlmann, L L ^a   Schreiber, R ^a   Siegel, M ^a   Qin, Y L ^a   Zimina, A ^b  

^a FORSCHUNGSZENTRUM JÜLICH   (Germany)

^b HAHN MEITNER INSTITUT   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC CONDUCTIVITY; ELECTRON TUNNELING; LOW ENERGY ELECTRON DIFFRACTION; METALLIC FILMS; MOLECULAR BEAM EPITAXY; MULTILAYERS; SEMICONDUCTING FILMS; TRANSMISSION ELECTRON MICROSCOPY; X RAY SPECTROSCOPY;

EXCHANGE COUPLING; FERROMAGNETIC FILMS; NEAR EDGE X RAY ABSORPTION SPECTROSCOPY; SEMICONDUCTING INTERLAYERS;

FERROMAGNETIC MATERIALS;

EID: 0037433318     PISSN: 09538984     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-8984/15/5/301     Document Type: Article

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