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Volumn 51, Issue 8, 2003, Pages 2219-2234

Stress induced diffusion along adhesional contact interfaces

Author keywords

Adhesional contact; Bond strength; Gold wire; Interface self diffusion; Room temperature bonding; Stress relaxation; Surface energy; Transient behavior; Vacancy diffusion

Indexed keywords

ACTIVATION ENERGY; ADHESION; GOLD; INTERFACES (MATERIALS); INTERFACIAL ENERGY; RESIDUAL STRESSES; STRESS RELAXATION; WIRE;

EID: 0037425405     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1359-6454(03)00015-6     Document Type: Article
Times cited : (19)

References (27)
  • 20
    • 0012701878 scopus 로고
    • edited by Japan Matel Society, Sendai
    • Metals handbook edited by Japan Matel Society, Sendai, 1982;4:957.
    • (1982) Metals Handbook , vol.4 , pp. 957
  • 22
    • 0012755007 scopus 로고    scopus 로고
    • Third, revised and enlarged edition, Cahn RW, Haasen P., editors, Amsterdam: North-Holland Physics Publishing
    • Wollenberger HJ., Physical metallurgy (Part II), Third, revised and enlarged edition, Cahn RW, Haasen P., editors, Amsterdam: North-Holland Physics Publishing p.1140.
    • Physical Metallurgy (Part II) , pp. 1140
    • Wollenberger, H.J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.