Patterned distribution of silicon nanocrystals prepared by pulsed laser interference crystallization of an ultrathin a-Si:H single layer

Journal of Physics Condensed Matter

Volumn 15, Issue 4, 2003, Pages 609-615

  Wang, Xiaowei ^a   Qiao, Feng ^a   Zhu, Leyi ^a   Huang, Xinfan ^a   Li, Jian ^a   Li, Wei ^a   Li, Xuefei ^a   Kang, Lin ^a   Chen, Kunji ^a  

^a NANJING UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRYSTALLIZATION; EXCIMER LASERS; PHASE MODULATION; PHASE TRANSITIONS; PULSED LASER APPLICATIONS; RAMAN SCATTERING; SCANNING ELECTRON MICROSCOPY; SILICON; TRANSMISSION ELECTRON MICROSCOPY;

PULSED LASER INTERFERENCE CRYSTALLIZATION; RAMAN SCATTERING SPECTROSCOPY; SILICON NANOCRYSTALS; TWO DIMENSIONAL PATTERNED DISTRIBUTION;

NANOSTRUCTURED MATERIALS;

EID: 0037420012     PISSN: 09538984     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-8984/15/4/301     Document Type: Article

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