Relevance of organic field effect transistor models: Simulation vs. experiment

Synthetic Metals

Volumn 137, Issue 1-3, 2003, Pages 1451-1452

  Scheinert, S ^a   Paasch, G ^b   Lindner, T ^b  

^a ILMENAU UNIVERSITY OF TECHNOLOGY   (Germany)

^b IFW DRESDEN   (Germany)

Author keywords

Conjugated Polymers; Device simulation; Organic field effect transistor; Traps

Indexed keywords

COMPUTER SIMULATION; ELECTRON TRAPS; FIELD EFFECT TRANSISTORS; HOLE TRAPS;

ORGANIC FIELD EFFECT TRANSISTORS;

SEMICONDUCTING POLYMERS;

EID: 0037419063     PISSN: 03796779     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0379-6779(02)01176-1     Document Type: Conference Paper

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