Scan-induced patterning in glassy polymer films: Using scanning force microscopy to study plastic deformation at the nanometer length scale

Langmuir

Volumn 19, Issue 3, 2003, Pages 898-909

  Schmidt, Ronald H ^a   Haugstad, Greg ^b   Gladfelter, Wayne L ^a  

^a University of Minnesota   (United States)

^b UNIVERSITY OF MINNESOTA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; FRICTION; GLASS TRANSITION; PLASTIC DEFORMATION; POLYSTYRENES; POLYVINYL ACETATES;

FILM VOLUME; GLASSY POLYMER FILMS; SCAN INDUCED PATTERNING; SCANNING FORCE MICROSCOPY; SECOND ORDER PHASE TRANSITION; THIN GLASSY FILMS;

THIN FILMS;

EID: 0037418086     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la015769j     Document Type: Article

References (57)

1. Leung, O. M.; Goh, C. Science 1992, 255, 64-66.
2. Meyers, G. F.; DeKoven, B. M.; Seitz, J. T. Langmuir 1992, 8, 2330-2335.
3. Woodland, D. D.; Unertl, W. N. Wear 1997, 203-204, 685-691.
4. Pickering, J. P.; Vancso, G. J. Appl. Surf. Sci. 1999, 148, 147-154.
5. Hamada, E.; Kaneko, R. J. Phys. D 1992, 25, A53-A56.
6. Kaneko, R.; Hamada, E. Wear 1993, 162-164, 370-377.
7. Iwata, F.; Matsumoto, T.; Sasaki, A. Nanotechnology 2000, 11, 10-15.
8. Khurshudov, A.; Kata, K. Wear 1997, 205, 1-10.
9. Nie, H. Y.; Motomatsu, M.; Mizutani, W.; Tokumoto, H. J. Vac. Sci. Technol., B 1995, 13, 1163-1166.
10. Lea, A. S.; Pungor, A.; Hlady, V.; Andrade, J. D.; Herron, J. N.; Voss, E. W. Jr. Langmuir 1992, 8, 68-73.
11. Jing, J.; Henriksen, P. N.; Wang, H.; Marteny, P. J. Mater. Sci. 1995, 30, 5700-5704.
12. Elkaakour, Z.; Aimé, J. P.; Bouhacina, T.; Odin, C.; Masuda, T. Phys. Rev. Lett. 1994, 73, 3231-3234.
13. Pidduck, A. J.; Haslam, S.D.; Bryan-Brown, G. P.; Bannister, R.; Kitely, I. D. Appl. Phys. Lett. 1997, 71, 2907-2909.
14. Nie, H. Y.; Motomatsu, M.; Mizutani, W.; Tokumoto, H. J. Vac. Sci. Technol., B 1997, 15, 1388-1393.
15. Ruetschi, M.; Grutter, P.; Funfschilling, J.; Guntherodt, H. J. Science 1994, 265, 512-514.
16. Schmidt, R. H.; Haugstad, G.; Gladfelter, W. L. Langmuir 1999, 15, 317-321.
17. Schmidt, R.H.; Haugstad, G.; Gladfelter, W.L. In Microstructure and Microtribology of Polymer Surfaces; Tsukruk, V. V., Wahl, K. J., Eds.; ACS Symposium Series, Vol. 741; American Chemical Society: Washington, DC, 2000; pp 227-238.
18. Okorn-Schmidt, H. F. IBM J. Res. Dev. 1999, 43, 351-365.
19. Command Reference Manual - Version 4.10; Digital Instruments, Inc.: Santa Barbara, CA 93103.
20. The Piezo Book; Burleigh Instruments, Inc.: Fishers, NY 14453-0755.
21. Haugstad, G.; Gladfelter, W. L.; Weberg, E. B.; Weberg, R. T.; Weatherill, T. D. Langmuir 1994, 10, 4295-4306.
22. 2 becomes significant for dZ/dX > 0.3. If the pattern shown in Figure 3 is approximated as a sinusoidal wave of amplitude 2.5 nm and repeat distance 70 nm, |dZ/dX| has a maximum value of 0.2. Thus, for this case the quadratic term can be neglected.
23. Haugstad, G.; Gladfelter, W. L.; Weberg, E. B.; Weberg, R. T.; Jones, R. R. Langmuir 1995, 11, 3473-3482.
24. Because the peaks observed in the power spectra are broad and therefore yield a determination of λ lacking precision, the λ values plotted in the bottom of Figure 8 were instead determined in real space.
25. Schallamach, A. Wear 1971, 17, 301-312.
26. Thompson, P.; Robbins, M. Science 1990, 250, 792-794.
27. Robbins, M. O.; Thompson, P. A. Science 1991, 253, 916.
28. Israelachvili, J. N.; Gee, M. L.; McGuiggan, P.; Thompson, P.; Robbins, M. In Dynamics in Small Confining Systems; Drake, J. M., Klfafter, J., Kopelman, R., Eds.; MRS Publications: 1990; pp 3-6.
29. Israelachvili, J. N.; McGuiggan, P.; Gee, M.; Homola, A.; Robbins, M.; Thompson, P. J. Phys.: Condens. Matter 1990, 2, SA89-SA98.
30. Yoshizawa, H.; Israelachvili, J. N. J. Phys. Chem. 1993, 97, 11300-11313.
31. Yoshizawa, H.; Chen, Y. L.; Israelachvili, J. J. Phys. Chem. 1993, 97, 4128-4140.
32. Hiemenz, P. C. Polymer Chemistry; Marcel Dekker: New York, 1984.
33. Hammerschmidt, J. A.; Moasser, B.; Gladfelter, W. L.; Haugstad, G.; Jones, R. R. Macromolecules 1996, 29, 8996-8998.
34. Hammerschmidt, J. A.; Haugstad, G.; Gladfelter, W. L. Macromolecules 1999, 32, 3360.
35. Kramer, E. J.; Berger, L. L. Adv. Polym. Sci. 1990, 91/92, 1-68.
36. Strobl, G. The Physics of Polymers, Springer-Verlag: Berlin, 1995.
37. Friedrich, K.; Kausch, H. Adv. Polym. Sci. 1983, 52/53, 225-274.
38. Jang, B. Z.; Uhlmann, D. R.; Vander Sande, J. B. Polym. Eng. Sci. 1985, 25, 98-112.
39. Narisawa, I.; Ishikawa, M. Adv. Polym. Sci. 1990, 91/92, 353-391.
40. Kambour, R. P. Macromol. Rev. 1973, 7, 1.
41. Keddie, J. L.; Jones, R. A. L.; Cory, R. A. Europhys. Lett. 1994, 27, 59-64.
42. Keddie, J. L.; Jones, R. L.; Cory, R. A. Faraday Discuss. 1994, 98, 219-230.
43. Forrest, J. A.; Dalnoki-Veress, K.; Stevens, J. R.; Dutcher, J. R. Phys. Rev. Lett. 1996, 77, 2002-2005.
44. Forrest, J. A.; Dalnoki-Veress, K.; Dutcher, J. R. Phys. Rev. E 1997, 56, 5705-5716.
45. Forrest, J. A.; Dalnoki-Veress, K. Adv. Colloid Interface Sci. 2001, 94, 167-196.
46. Forrest, J. A.; Mattson, J. Phys. Rev. E 2000, 61, 53-56.
47. Jones, R. L.; Kumar, S. K.; Ho, D. L.; Briber, R. M.; Russell, T. P. Nature 1999, 400, 146-149.
48. Brown, H. R.; Russell, T. P. Macromolecules 1996, 29, 798-800.
49. Forrest, J. A.; Dalnoki-Veress, K.; Dutcher, J. R. Phys. Rev. E 1998, 58, 6109-6114.
50. Wallace, W. E.; Beck Tan, N. C.; Wu, W. L. J. Chem. Phys. 1998, 108, 3798-3804.
51. van Zanten, J. H.; Wallace, W. E.; Wu, W. L. Phys. Rev. E 1996, 53, R2053-R2056.
52. Grohens, Y.; Brogly, M.; Labbe, C.; David, M.; Schultz, J. Langmuir 1998, 14, 2929-2932.
53. Tsui, O. K. C.; Russell, T. P. Macromolecules 2001, 34, 5535-5539.
54. g than did increased orientation or chain extension.
55. Haugstad, G.; Hammerschmidt, J. A.; Gladfelter, W. L. In Interfacial Properties on the Submicrometer Scale; Frommer, J., Overney, R. M., Eds.; American Chemical Society: Washington, DC, 2001; Vol. 781.
56. 12 however, the degree of crystallinity is unknown.
57. Schwab, A. D.; Agra, D. M. G.; Kim, J.; Kumar, S.; Dhinojwala, A. Macromolecules 2000, 33, 4903-4909.