An event bias technique for Monte Carlo device simulation

Mathematics and Computers in Simulation

Volumn 62, Issue 3-6, 2003, Pages 367-375

  Kosina, H ^a   Nedjalkov, M ^a   Selberherr, S ^a  

^a INSTITUTE FOR MICROELECTRONICS   (Austria)

Author keywords

Boltzmann equation; Device simulation; Event bias technique; Monte Carlo method; Variance reduction

Indexed keywords

BOUNDARY VALUE PROBLEMS; COMPUTER SIMULATION; ERROR ANALYSIS; MONTE CARLO METHODS; SEMICONDUCTOR DEVICES;

VARIANCE REDUCTION;

STATISTICAL METHODS;

EID: 0037416990     PISSN: 03784754     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0378-4754(02)00245-8     Document Type: Conference Paper

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