High-accuracy determination of the dependence of the photoluminescence emission energy on alloy composition in AlxGa1-xAs films

Journal of Applied Physics

Volumn 93, Issue 7, 2003, Pages 3747-3759

  Robins, Lawrence H ^a   Armstrong, John T ^a   Marinenko, Ryna B ^a   Paul, Albert J ^a   Pellegrino, Joseph G ^a,b   Bertness, Kristine A ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b BAE SYSTEMS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM ALLOYS; CALIBRATION; CORRELATION METHODS; HIGH ENERGY ELECTRON DIFFRACTION; MOLECULAR BEAM EPITAXY; PHOTONS; WAVELENGTH DISPERSIVE SPECTROSCOPY;

ELECTRON MICROPROBE ANALYZERS;

PHOTOLUMINESCENCE;

EID: 0037390993     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1556554     Document Type: Article

References (20)

1. T. E. Gills, S. Dittman, J. R. Rumble, C. S. Brickenkamp, G. L. Harris, and N. M. Trahey, J. Res. Natl. Inst. Stand. Technol. 106, 315 (2001).
2. H. C. Casey and M. B. Panish, Heterostructure Lasers (Academic, New York, 1978), pp. 191-194.
3. N. C. Miller, S. Zemon, G. P. Werber, and W. Powaznik, J. Appl. Phys. 57, 512 (1985).
4. D. E. Aspnes, S. M. Kelso, R. A. Logan, and R. Bhat, J. Appl. Phys. 60, 754 (1986).
5. T. F. Kuech, D. J. Wolford, R. Potemski, J. A. Bradley, K. H. Kelleher, D. Yan, J. P. Farrell, P. M. S. Lesser, and F. H. Pollak, Appl. Phys. Lett. 51, 505 (1987).
6. B. Lambert, J. Caulet, A. Regreny, M. Baudet, and B. Deveaud, Semicond. Sci. Technol. 2, 491 (1987).
7. G. Oelgart, R. Schwabe, M. Heider, and B. Jacobs, Semicond. Sci. Technol. 2, 468 (1987).
8. C. Bosio, J. L. Staehli, M. Guzzi, G. Burri, and R. A. Logan, Phys. Rev. B 38, 3263 (1988).
9. D. Huang, G. Ji, U. K. Reddy, H. Morkoc, F. Xiong, and T. A. Tombrello, J. Appl. Phys. 63, 5447 (1988).
10. Z. R. Wasilewski, M. M. Dion, D. J. Lockwood, P. Poole, R. W. Streater, and A. J. SpringThorpe, J. Appl. Phys. 81, 1683 (1997).
11. C. E. C. Wood, in The Technology and Physics of Molecular-beam Epitaxy, edited by E. H. C. Parker (Plenum, New York, 1985), p. 67.
12. Reference to specific products or trade names does not constitute an endorsement by the National Institute of Standards and Technology. Other vendors may provide products of comparable or superior value.
13. P. Lautenschlager, M. Garriga, S. Logothetidis, and M. Cardona, Phys. Rev. B 35, 9174 (1986).
14. S. Logothetidis, M. Cardona, and M. Garriga, Phys. Rev. B 43, 11950 (1991).
15. E. Grilli, M. Guzzi, R. Zamboni, and L. Pavesi, Phys. Rev. B 45, 1638 (1992).
16. A. Venu Gopal, R. Kumar, A. S. Vengurlekar, A. Bosacchi, S. Franchi, and L. N. Pfeiffer, J. Appl. Phys. 87, 1858 (2000).
17. B. Monemar, Phys. Rev. B 8, 5711 (1973).
18. Z. R. Wasilewski, M. M. Dion, D. J. Lockwood, P. Poole, R. W. Streater, and A. J. SpringThorpe, J. Appl. Phys. 81, 1683 (1997).
19. D. Zhou and B. F. Usher, J. Phys. D 34, 1461 (2001).
20. M. Oetzel and G. Heger, J. Appl. Crystallogr. 32, 799 (1999).