Ion to neutral yield ratio in near 180° backscattering of keV He+ ions from insulating targets

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 203, Issue , 2003, Pages 239-245

  Morita, K ^a   Yoshii, A ^a  

^a NAGOYA UNIVERSITY   (Japan)

Author keywords

Auger neutralization; Electronic sputtering; Insulating target; Ion fraction; Low energy ion backscattering; TOF analysis

Indexed keywords

CHARGE TRANSFER; ELECTRON EMISSION; INSULATING MATERIALS; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SURFACE REACTIONS;

LOW ENERGY ION BACKSCATTERING;

ION BEAMS;

EID: 0037389191     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(02)02223-1     Document Type: Conference Paper

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