TOF analysis of reflection of low-energy light ions from solid targets using coaxial impact collision ion scattering spectroscopy (CAICISS)

Journal of Nuclear Materials

Volumn 290-293, Issue , 2001, Pages 126-130

  Morita, K ^a,b   Kishi, N ^a   Grigoriev, A ^a   Masuzaki, S ^a   Muroga, T ^a  

^a NAGOYA UNIVERSITY   (Japan)

^b NATIONAL INSTITUTE FOR FUSION SCIENCE   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL LATTICES; DEUTERIUM; HELIUM; KINETIC ENERGY; PLASMAS; SILICON; SPECTROSCOPIC ANALYSIS;

COAXIAL IMPACT COLLISION ION SCATTERING SPECTROSCOPY (CAICISS);

HIGH ENERGY PHYSICS;

EID: 0035278590     PISSN: 00223115     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-3115(00)00559-6     Document Type: Article

References (6)

1. M.W. Thompson, Nucl. Instrum, and Meth. B 18 (1987) 411.
2. K. Sumitomo, K. Oura, I. Katayama, F. Shoji, T. Hanawa, Nucl. Instrum. and Meth. B 33 (1988) 871.
3. K. Morita, Jpn. J. Appl. Phys. 22 (1983) 1112.
4. D. Nakamura, J. Yuhara, K. Morita, Nucl. Instrum. and Meth. B 157 (1999) 279.
5. K.B. Winterbon, P. Sigmund, J.B. Sanders, K. Dan. Vid. Selsk. Mat. Fgs. Medd. 37 (14) (1970).
6. N. Kishi, K. Morita, to be published.