Real-time surface composition and roughness analysis in MBE using RHEED-induced X-ray fluorescence

Journal of Crystal Growth

Volumn 251, Issue 1-4, 2003, Pages 68-72

  Braun, Wolfgang ^a   Ploog, Klaus H ^a  

^a PAUL DRUDE INSTITUT FÜR FESTKÖRPERELEKTRONIK   (Germany)

Author keywords

A1. Characterization; A1. Reflection high energy electron diffraction; A1. Surface structure; A1. X ray fluorescence; A3. Molecular beam epitaxy; B2. Semiconducting III V materials

Indexed keywords

FLUORESCENCE; REFLECTION HIGH ENERGY ELECTRON DIFFRACTION; SURFACE ROUGHNESS; X RAYS;

X RAY FLUORESCENCE;

MOLECULAR BEAM EPITAXY;

EID: 0037381423     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0248(02)02180-2     Document Type: Conference Paper

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