Anomalous x-ray yields under surface wave resonance during reflection high energy electron diffraction and adatom site determination

Physical Review Letters

Volumn 84, Issue 19, 2000, Pages 4389-4392

  Yamanaka, Toshiro ^a,b   Ino, Shozo ^a,c  

^a UNIVERSITY OF TOKYO   (Japan)

^b HOKKAIDO UNIVERSITY   (Japan)

^c UTSUNOMIYA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000156468     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.84.4389     Document Type: Article

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