A photoelectron diffraction study of the surface-V2O3 (2 × 2) layer on Pd(1 1 1)

Surface Science

Volumn 529, Issue 1-2, 2003, Pages

  Sambi, M ^a   Petukhov, M ^a,d   Domenichini, B ^a,e   Rizzi, G A ^a   Surnev, S ^b   Kresse, G ^c   Netzer, F P ^b   Granozzi, G ^a  

^a UNIVERSITY OF PADOVA   (Italy)

^b UNIVERSITY OF GRAZ   (Austria)

^c UNIVERSITY OF VIENNA   (Austria)

^d KURCHATOV INSTITUTE   (Russian Federation)

^e UNIVERSITÉ DE BOURGOGNE   (France)

Author keywords

Growth; Palladium; Photoelectron diffraction; Surface structure, morphology, roughness, and topography; Vanadium oxide

Indexed keywords

FILM GROWTH; PALLADIUM; PHASE INTERFACES; PROBABILITY DENSITY FUNCTION; SCANNING TUNNELING MICROSCOPY; SURFACES; VANADIUM COMPOUNDS; X RAY PHOTOELECTRON SPECTROSCOPY;

PHOTOELECTRON DIFFRACTION;

SURFACE STRUCTURE;

EID: 0037376026     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(03)00070-0     Document Type: Article

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