Interrelation between microstructure and optical properties of erbium-doped nanocrystalline thin films

Physica E: Low-Dimensional Systems and Nanostructures

Volumn 16, Issue 3-4, 2003, Pages 414-419

  Losurdo, M ^a   Cerqueira, M F ^b   Alves, E ^c   Stepikhova, M V ^d   Giangregorio, M M ^a   Bruno, G ^a  

^a CNR Consiglio Nazionale delle Ricerche   (Italy)

^b UNIVERSITY OF MINHO   (Portugal)

^c INSTITUTO SUPERIOR TÉCNICO   (Portugal)

^d INSTITUTE FOR PHYSICS OF MICROSTRUCTURES   (Russian Federation)

Author keywords

Erbium doping; Films; nc Si; Optical properties; Spectroscopic ellipsometry

Indexed keywords

DOPING (ADDITIVES); ELLIPSOMETRY; ERBIUM; INFRARED RADIATION; MICROSTRUCTURE; PHOTOLUMINESCENCE; THIN FILMS;

SPECTROSCOPIC ELLIPSOMETRY;

NANOSTRUCTURED MATERIALS;

EID: 0037371981     PISSN: 13869477     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1386-9477(02)00617-3     Document Type: Conference Paper

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