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Volumn 422, Issue , 1996, Pages 143-148
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To probe the absorption edge of porous silicon by erbium
a a a a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
DOPING (ADDITIVES);
ELECTRIC EXCITATION;
ENERGY ABSORPTION;
IONS;
LUMINESCENCE OF INORGANIC SOLIDS;
PHOTOLUMINESCENCE;
POROUS SILICON;
SILICON;
ABSORPTION EDGE;
ERBIUM DOPED POROUS SILICON;
EXCITED CARRIERS;
HOST MATERIALS;
PHOTOLUMINESCENCE EXCITATION SPECTROSCOPY;
ERBIUM;
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EID: 0030387782
PISSN: 02729172
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1557/proc-422-143 Document Type: Conference Paper |
Times cited : (8)
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References (9)
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