A technique to measure Poisson's ratio of ultrathin polymeric films using atomic force microscopy

Review of Scientific Instruments

Volumn 74, Issue 2, 2003, Pages 1043-1047

  Bhushan, Bharat ^a   Mokashi, Prasad S ^a   Ma, Tiejun ^a  

^a OHIO STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELASTIC MODULI; POISSON RATIO; STRAIN; STRESSES; SURFACE TOPOGRAPHY; ULTRATHIN FILMS;

ULTRATHIN POLYMERIC FILMS;

PLASTIC FILMS;

EID: 0037327234     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1531827     Document Type: Article

References (5)

1. B. Bhushan, Mechanics and Reliability of Flexible Magnetic Media, 2nd ed. (Springer, New York, 2000).
2. D. Richards and M. Sharrock, IEEE Trans. Magn. 34, 1878 (1998).
3. T. Ma, B. Bhushan, H. Murooka, I. Kobayashi, and T. Osawa, Rev. Sci. Instrum. 73, 1813 (2002).
4. M. S. Bobji and B. Bhushan, Scr. Mater. 44, 37 (2001).
5. M. S. Bobji and B. Bhushan, J. Mater. Res. 16, 844 (2001).