Atomic scale imaging: A hands-on scanning probe microscopy laboratory for undergraduates

Journal of Chemical Education

Volumn 80, Issue 2, 2003, Pages 194-197

  Zhong, Chuan Jian ^a   Han, Li ^a   Maye, Mathew M ^a   Luo, Jin ^a   Kariuki, Nancy N ^a   Jones Jr , Wayne E ^a  

^a BINGHAMTON UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; COMPUTER SIMULATION; IMAGING TECHNIQUES; SCANNING TUNNELING MICROSCOPY; STUDENTS; TRANSMISSION ELECTRON MICROSCOPY;

ATOMIC SCALE IMAGING;

EDUCATION;

EID: 0037312406     PISSN: 00219584     EISSN: None     Source Type: Journal    
DOI: 10.1021/ed080p194     Document Type: Article

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