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Volumn 74, Issue 9, 1997, Pages 1087-1089
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Getting close with the instructional scanning tunneling microscope
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0001725797
PISSN: 00219584
EISSN: None
Source Type: Journal
DOI: 10.1021/ed074p1087 Document Type: Article |
Times cited : (14)
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References (8)
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