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Volumn 80, Issue 2, 2003, Pages 187-193

Visualizing atoms, molecules, and surfaces by scanning probe microscopy

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; IMAGE ANALYSIS; SCANNING TUNNELING MICROSCOPY; STUDENTS; ULTRAVIOLET LAMPS;

EID: 0037311977     PISSN: 00219584     EISSN: None     Source Type: Journal    
DOI: 10.1021/ed080p187     Document Type: Article
Times cited : (18)

References (29)
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    • The following Internet sites provide excellent introductions to the (accessed Oct 2002)
    • The following Internet sites provide excellent introductions to the SPM technique: A Practical Guide to Scanning Probe Microscopy. http://www.thermomicro.com/spmguide/contents.htm (accessed Oct 2002); Scanning Probe/Atomic Force Microscopy: Technology Overview and Update. http://www.di.com/AppNotes/AmLab/AL-SPMmain.html (accessed Oct 2002).
    • SPM Technique: A Practical Guide to Scanning Probe Microscopy
  • 7
    • 0013092004 scopus 로고    scopus 로고
    • (accessed Oct 2002)
    • The following Internet sites provide excellent introductions to the SPM technique: A Practical Guide to Scanning Probe Microscopy. http://www.thermomicro.com/spmguide/contents.htm (accessed Oct 2002); Scanning Probe/Atomic Force Microscopy: Technology Overview and Update. http://www.di.com/AppNotes/AmLab/AL-SPMmain.html (accessed Oct 2002).
    • Scanning Probe/Atomic Force Microscopy: Technology Overview and Update
  • 15
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    • Colton R. J., Engel, A., Frommer, J. E., Gaub, H. E., Gewirth, A. A., Guckenberger, R., Rabe, J., Heckl, W. M., Parkinson, B., Eds.; John Wiley & Sons: New York, and references therein
    • Hansma, H. G. in Procedures in Scanning Probe Microscopy; Colton R. J., Engel, A., Frommer, J. E., Gaub, H. E., Gewirth, A. A., Guckenberger, R., Rabe, J., Heckl, W. M., Parkinson, B., Eds.; John Wiley & Sons: New York, 1999; pp 389-393 and references therein.
    • (1999) Procedures in Scanning Probe Microscopy , pp. 389-393
    • Hansma, H.G.1
  • 16
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    • Colton R. J., Engel, A., Frommer, J. E., Gaub, H. E., Gewirth, A. A., Guckenberger, R., Rabe, J., Heckl, W. M., Parkinson, B., Eds.; John Wiley & Sons: New York
    • Lyubchenko, Y. L.; Lindsay, S. M. in Procedures in Scanning Probe Microscopy; Colton R. J., Engel, A., Frommer, J. E., Gaub, H. E., Gewirth, A. A., Guckenberger, R., Rabe, J., Heckl, W. M., Parkinson, B., Eds.; John Wiley & Sons: New York, 1999; pp 493-495.
    • (1999) Procedures in Scanning Probe Microscopy , pp. 493-495
    • Lyubchenko, Y.L.1    Lindsay, S.M.2
  • 18
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    • (accessed Oct 2002)
    • Intel Innovation in Education, http://www97.intel.com/education/index.asp (accessed Oct 2002).
    • Intel Innovation in Education
  • 24
    • 0013145945 scopus 로고    scopus 로고
    • Colton R. J., Engel, A., Frommer, J. E., Gaub, H. E., Gewirth, A. A., Guckenberger, R., Rabe, J., Heckl, W. M., Parkinson, B., Eds.; John Wiley & Sons: New York, and references therein
    • Yeo, Y. H.; McZZZGonigal, G. C.; Thomson, D. J. in Procedures in Scanning Probe Microscopy; Colton R. J., Engel, A., Frommer, J. E., Gaub, H. E., Gewirth, A. A., Guckenberger, R., Rabe, J., Heckl, W. M., Parkinson, B., Eds.; John Wiley & Sons: New York, 1999; pp 340-345 and references therein.
    • (1999) Procedures in Scanning Probe Microscopy , pp. 340-345
    • Yeo, Y.H.1    McGonigal, G.C.2    Thomson, D.J.3
  • 25
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    • Venkataraman, B; Flynn, G. W.; Wilbur, J. L.; Folkers, J. P.; Whitesides, G. M. J. Phys. Chem. 1995, 99, 8684-8689; Cyr, D. M.; Venkataraman, B.; Flynn, G. W.; Black, A.; Whitesides, G. M. J. Phys. Chem. 1996, 100, 13747-13759; Giancarlo, L.; Cyr, D. M.; Muyskens, K.; Flynn, G. W. Langmuir 1998, 111, 321-335.
    • (1995) J. Phys. Chem. , vol.99 , pp. 8684-8689
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.