Influence of microstructures on exchange bias behaviors of La0.7Sr0.3MnO3/La0.33Ca0.67 MnO3 bilayers

Solid State Communications

Volumn 125, Issue 6, 2003, Pages 305-309

  Kim, D W ^a,b   Noh, T W ^a   Tanaka, H ^c   Kawai, T ^c  

^a Seoul National University   (South Korea)

^b Samsung Advanced Institute of Technology (SAIT)   (South Korea)

^c OSAKA UNIVERSITY   (Japan)

Author keywords

A. Magnetic films and multilayers; B. Epitaxy; D. Electronic transport

Indexed keywords

ANTIFERROMAGNETIC MATERIALS; GRAIN SIZE AND SHAPE; MICROSTRUCTURE; PULSED LASER DEPOSITION; THIN FILMS;

FERROMAGNETIC BILAYERS;

LANTHANUM COMPOUNDS;

EID: 0037303791     PISSN: 00381098     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0038-1098(02)00822-0     Document Type: Article

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