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Volumn 248, Issue SUPPL., 2003, Pages 463-467

Growth and characterization of high quality BxGa1-xAs/GaAs(0 0 1) epilayers

Author keywords

A1. Atomic force microscopy; A3. Metalorganic vapor phase epitaxy; B1. BGaAs; B1. Diborane

Indexed keywords

ATOMIC FORCE MICROSCOPY; CHARACTERIZATION; CRYSTALLINE MATERIALS; DIFFRACTION; METALLORGANIC VAPOR PHASE EPITAXY; SUPERSATURATION; SURFACE ROUGHNESS; X RAY ANALYSIS;

EID: 0037292349     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0248(02)01822-5     Document Type: Conference Paper
Times cited : (30)

References (11)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.