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Volumn 248, Issue SUPPL., 2003, Pages 463-467
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Growth and characterization of high quality BxGa1-xAs/GaAs(0 0 1) epilayers
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Author keywords
A1. Atomic force microscopy; A3. Metalorganic vapor phase epitaxy; B1. BGaAs; B1. Diborane
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
CHARACTERIZATION;
CRYSTALLINE MATERIALS;
DIFFRACTION;
METALLORGANIC VAPOR PHASE EPITAXY;
SUPERSATURATION;
SURFACE ROUGHNESS;
X RAY ANALYSIS;
TERNARY COMPOUNDS;
BORON COMPOUNDS;
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EID: 0037292349
PISSN: 00220248
EISSN: None
Source Type: Journal
DOI: 10.1016/S0022-0248(02)01822-5 Document Type: Conference Paper |
Times cited : (30)
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References (11)
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