Relations between basic nuclear data and single-event upsets phenomena

MRS Bulletin

Volumn 28, Issue 2, 2003, Pages 121-125

  Blomgren, Jan ^a   Granbom, Bo ^b   Granlund, Thomas ^b   Olsson, Nils ^a  

^a UPPSALA UNIVERSITY   (Sweden)

^b NONE

Author keywords

Microelectronics; Nuclear data; Single event upsets

Indexed keywords

CHARGED PARTICLES; COSMIC RAYS; CURVE FITTING; NEUTRONS; NUCLEAR PHYSICS; PROTONS; RADIATION EFFECTS;

NEUTRON NUCLEUS SPALLATION REACTIONS; QUASI MONOENERGETIC NEUTRON BEAMS; SINGLE EVENT UPSETS;

MICROELECTRONIC PROCESSING;

EID: 0037291195     PISSN: 08837694     EISSN: None     Source Type: Journal    
DOI: 10.1557/mrs2003.39     Document Type: Article

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