The combined application of nanoindentation and scanning probe microscopy to materials sciences

Materials Science Forum

Volumn 414-415, Issue , 2003, Pages 297-304

  Nagy, Péter ^a   Csanády, Ágnes ^b   Vero, Balázs ^b   Pálinkás, Gábor ^a   Kálmán, Erika ^a,b  

^a CHEMICAL RESEARCH CENTER   (Hungary)

^b BAY ZOLTÁN NONPROFIT LTD FOR APPLIED RESEARCH   (Hungary)

Author keywords

Atomic force microscopy; Hardness test; Nanoindentation; Pile up; Relaxation; Shape distortion; Sinking in

Indexed keywords

ATOMIC FORCE MICROSCOPY; INDENTATION; MICROHARDNESS; RELAXATION PROCESSES; SURFACE ROUGHNESS;

NANOINDENTATION;

MATERIALS SCIENCE;

EID: 0037272391     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/msf.414-415.297     Document Type: Conference Paper

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