In situ optical characterization of the alignment and density of carbon nanotubes

Nanotechnology

Volumn 14, Issue 1, 2003, Pages 46-49

  Kim, Do Hyung ^a   Jang, Hoon Sik ^a   Kim, Chang Duk ^a   Cho, Dong Soo ^a   Jee, Jong Gi ^a   Lee, Hyeong Rag ^a  

^a Kyungpook National University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

AMMONIA; CHARACTERIZATION; CRYSTAL GROWTH; ELECTRIC FIELD EFFECTS; ELECTRONIC DENSITY OF STATES; ELECTRONIC STRUCTURE; LIGHT INTERFERENCE; OPTICAL PROPERTIES; PLASMA ENHANCED CHEMICAL VAPOR DEPOSITION;

CARBON NANOTUBE GROWTH; IN SITU OPTICAL INTERFERENCE PATTERNS; INTERFERENCE OSCILLATIONS;

CARBON NANOTUBES;

EID: 0037259425     PISSN: 09574484     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-4484/14/1/311     Document Type: Article

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