Design of accelerated reliability tests based on simple-step-stress model

Proceedings of the Annual Reliability and Maintainability Symposium

Volumn , Issue , 2003, Pages 111-116

  Takemoto, Yasuhiko ^a   Arizono, Ikuo ^a  

^a Osaka Prefecture University   (Japan)

Author keywords

Accelerated reliability tests; Mean time to failure (MTTF); Shape parameter; Simple step stress model; Variable sampling plan; Weibull distribution

Indexed keywords

FAILURE ANALYSIS; MATHEMATICAL MODELS; PRODUCT DESIGN; PRODUCT DEVELOPMENT; STRESSES; WEIBULL DISTRIBUTION;

ACCELERATED RELIABILITY TESTS; MEAN TIME TO FAILURE; SIMPLE STEP STRESS MODEL; VARIABLE SAMPLING PLAN;

RELIABILITY;

EID: 0037255915     PISSN: 0149144X     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (10)

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