The deposition angle-dependent density of amorphous solid water films

Journal of Chemical Physics

Volumn 118, Issue 1, 2003, Pages 364-372

  Dohnalek Z ^a   Kimmel, Greg A ^a   Ayotte, Patrick ^a   Smith, R Scott ^a   Kay, Bruce D ^a  

^a PACIFIC NORTHWEST NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; COMPUTER SIMULATION; DENSITY (SPECIFIC GRAVITY); FILM GROWTH; INTERFEROMETRY; MASS SPECTROMETERS; MOLECULAR BEAMS; REFRACTIVE INDEX; TEMPERATURE PROGRAMMED DESORPTION; ULTRAHIGH VACUUM;

AMORPHOUS SOLID WATER FILMS; DEPOSITION ANGLE-DEPENDENT DENSITY; FRESNEL COEFFICIENTS; QUADRUPOLE MASS SPECTROMETER;

AMORPHOUS FILMS;

EID: 0037255490     PISSN: 00219606     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1525805     Document Type: Article

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