Effect of roughness on the conductivity of semiconducting thin films/quantum wells with double rough boundaries

Journal of Applied Physics

Volumn 93, Issue 1, 2003, Pages 320-324

  Palasantzas, G ^a   De Hosson, J Th M ^a  

^a UNIVERSITY OF GRONINGEN   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER CONCENTRATION; ELECTRIC CONDUCTIVITY; ELECTRON GAS; ELECTRON MOBILITY; MICROELECTRONICS; SEMICONDUCTOR QUANTUM WELLS; SURFACE ROUGHNESS;

ROUGHNESS SCATTERING;

THIN FILMS;

EID: 0037245740     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1522490     Document Type: Article

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