Head-disk interfacial behavior in glide tests for manufacturing hard disks

Materials and Manufacturing Processes

Volumn 18, Issue 1, 2003, Pages 123-134

  Zhong, Z W ^a   Zheng, Z ^a  

^a NANYANG TECHNOLOGICAL UNIVERSITY   (Singapore)

Author keywords

Avalanche point; Bump avalanche curve; Bump disk; Bump height; Burnishing; Flying height; Glide head calibration; Glide test; Hard disk manufacturing; Head disk interfacial behavior; Laser bumps; Magnetic disk; Piezoelectric transducer; Smoothness; Z height

Indexed keywords

BURNISHING; CALIBRATION; GRAPHIC METHODS; HARD DISK STORAGE; SURFACE ROUGHNESS; THIN FILMS;

BUMP AVALANCHE TEST; GLIDE TEST; HEAD DISK INTERFACIAL BEHAVIOR;

INTERFACES (MATERIALS);

EID: 0037221158     PISSN: 10426914     EISSN: None     Source Type: Journal    
DOI: 10.1081/AMP-120017594     Document Type: Article

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