Structure of highly strained ultrathin Ni films on Pd(1 0 0)

Surface Science

Volumn 522, Issue 1-3, 2003, Pages 1-7

  Rizzi, G A ^a   Petukhov, M ^b   Sambi, M ^a   Granozzi, G ^a  

^a UNIVERSITY OF PADOVA   (Italy)

^b KURCHATOV INSTITUTE   (Russian Federation)

Author keywords

Epitaxy; Metallic films; Nickel; Palladium; Photoelectron diffraction; Surface stress

Indexed keywords

ELECTRONIC STRUCTURE; EPITAXIAL GROWTH; LOW ENERGY ELECTRON DIFFRACTION; METALLIC FILMS; NICKEL; PALLADIUM; STRAIN; ULTRATHIN FILMS; X RAY PHOTOELECTRON SPECTROSCOPY;

ANGLE-SCANNED PHOTOELECTRON DIFFRACTION;

SURFACE STRUCTURE;

EID: 0037211765     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(02)02412-3     Document Type: Article

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