Pseudomorphic growth of Ni films on Cu(001): A quantitative LEED analysis

Surface Science

Volumn 364, Issue 3, 1996, Pages 235-241

  Muller S ^a   Schulz, B ^b   Kostka, G ^a   Farle, M ^b   Heinz, K ^a   Baberschke, K ^b  

^a UNIVERSITY OF ERLANGEN NUREMBERG   (Germany)

^b FREIE UNIVERSITÄT BERLIN   (Germany)

Author keywords

Copper; Epitaxy; Low energy electron diffraction (LEED); Metal metal magnetic thin film structures; Metallic films; Nickel; Surface structure

Indexed keywords

EPITAXIAL GROWTH; FERROMAGNETIC RESONANCE; LATTICE CONSTANTS; LOW ENERGY ELECTRON DIFFRACTION; MAGNETIZATION; METALLIC FILMS; NICKEL; RELAXATION PROCESSES; SURFACE STRUCTURE; ULTRATHIN FILMS;

PSEUDOMORPHIC GROWTH; TETRAGONAL DISTORTION;

COPPER;

EID: 0030241251     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/0039-6028(96)00634-6     Document Type: Article

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