Local structures and electrical properties of organic molecular films investigated by non-contact atomic force microscopy

Applied Surface Science

Volumn 188, Issue 3-4, 2002, Pages 391-398

  Yamada, H ^a   Fukuma, T ^a   Umeda, K ^a   Kobayashi, K ^a   Matsushige, K ^a  

^a KYOTO UNIVERSITY   (Japan)

Author keywords

Charge transfer; Kelvin probe force microscopy (KFM); Non contact atomic force microscopy (NC AFM); Organic ferroelectric materials; Surface potential; Conjugated molecules

Indexed keywords

ATOMIC FORCE MICROSCOPY; CHARGE TRANSFER; EPITAXIAL GROWTH; FERROELECTRIC MATERIALS; IRRADIATION; MOLECULAR STRUCTURE; OLIGOMERS; THIN FILMS; VAN DER WAALS FORCES;

ORGANIC MOLECULAR FILMS; SCANNING PROBE MICROSCOPY (SPM);

SURFACE STRUCTURE;

EID: 0037187262     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(01)00956-4     Document Type: Conference Paper

References (22)