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Volumn 37, Issue 6 SUPPL. B, 1998, Pages 3834-3837
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Structures and local polarized domains of ferroelectric organic films studied by atomic force microscopy
a a a a |
Author keywords
Annealing temperature; Annealing time; Atomic force microscopy; P(VDF TrFE); Piezoelectric response; Polarized domain; Surface morphology
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Indexed keywords
ANNEALING;
COPOLYMERS;
CRYSTAL STRUCTURE;
ELECTRIC FIELDS;
FERROELECTRIC MATERIALS;
FLUORINE CONTAINING POLYMERS;
MORPHOLOGY;
PIEZOELECTRICITY;
SURFACE STRUCTURE;
THIN FILMS;
X RAY ANALYSIS;
ANNEALING TEMPERATURE;
ANNEALING TIME;
LOCAL POLARIZED DOMAIN;
PIEZOELECTRIC RESPONSE;
ATOMIC FORCE MICROSCOPY;
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EID: 0032090548
PISSN: 00214922
EISSN: None
Source Type: Journal
DOI: 10.1143/jjap.37.3834 Document Type: Article |
Times cited : (34)
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References (12)
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