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Volumn 47, Issue 19, 2002, Pages 3201-3209
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X-ray absorption spectroscopy studies of nickel oxide thin film electrodes for supercapacitors
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Author keywords
Nickel oxide; Non stoichiometry; Pseudocapacitance; Supercapacitor; X ray absorption spectroscopy
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Indexed keywords
ABSORPTION SPECTROSCOPY;
CAPACITORS;
ELECTROCHEMISTRY;
ELECTRONIC STRUCTURE;
HEAT TREATMENT;
NICKEL COMPOUNDS;
PRECIPITATION (CHEMICAL);
STOICHIOMETRY;
SYNTHESIS (CHEMICAL);
THERMAL EFFECTS;
THIN FILMS;
X RAY DIFFRACTION ANALYSIS;
X RAY SPECTROSCOPY;
SUPERCAPACITORS;
X-RAY ABSORPTION SPECTROSCOPY (XAS);
ELECTROCHEMICAL ELECTRODES;
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EID: 0037183310
PISSN: 00134686
EISSN: None
Source Type: Journal
DOI: 10.1016/S0013-4686(02)00240-2 Document Type: Article |
Times cited : (201)
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References (25)
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