Cyclic voltammetric studies of the effects of time and temperature on the capacitance of electrochemically deposited nickel hydroxide

Journal of Power Sources

Volumn 92, Issue 1-2, 2001, Pages 163-167

  Kalu, E E ^a   Nwoga, T T ^a   Srinivasan, V ^b   Weidner, J W ^b  

^a FAMU FSU COLLEGE OF ENGINEERING   (United States)

^b University of South Carolina   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; CAPACITANCE; CAPACITORS; CYCLIC VOLTAMMETRY; ELECTRIC CURRENTS; ELECTROCHEMISTRY; ELECTRODEPOSITION; PRECIPITATION (CHEMICAL); THERMAL EFFECTS; THIN FILMS;

ELECTROPRECIPITATION; NICKEL HYDROXIDE; NICKEL OXIDE;

NICKEL COMPOUNDS;

EID: 0035192566     PISSN: 03787753     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0378-7753(00)00520-6     Document Type: Article

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