Measurement of spatio-temporal terahertz field distribution by using chirped pulse technology

IEEE Journal of Quantum Electronics

Volumn 36, Issue 10, 2000, Pages 1214-1222

  Jiang, Zhiping ^a   Zhang, Xi Cheng ^a  

^a Research Rensselaer Polytechnic Institute   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFRACTION GRATINGS; ELECTROOPTICAL DEVICES; OPTICAL RESOLVING POWER; OPTICAL VARIABLES MEASUREMENT; OPTIMIZATION; OPTOELECTRONIC DEVICES; PULSED LASER APPLICATIONS; SENSITIVITY ANALYSIS; SPECTRUM ANALYSIS;

CHIRPED PULSE TECHNOLOGY; ELECTROOPTIC CRYSTAL; ELECTROOPTIC MODULATION; FREQUENCY SPECTRUM; MAGNETOOPTIC MEASUREMENT; OPTICAL PROBE PULSE; TERAHERTZ FIELD DISTRIBUTION;

ELECTROMAGNETIC FIELD MEASUREMENT;

EID: 0034292269     PISSN: 00189197     EISSN: None     Source Type: Journal    
DOI: 10.1109/3.880663     Document Type: Article

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