Using surface plasmon resonance and the quartz crystal microbalance to monitor in situ the interfacial behavior of thin organic films

Langmuir

Volumn 18, Issue 2, 2002, Pages 479-489

  Bailey, Larry E ^a   Kambhampati, Dev ^b   Kanazawa, Kay K ^a   Knoll, Wolfgang ^a,c   Frank, Curtis W ^a  

^a Stanford University   (United States)

^b Thermo Hybaid GmbH   (Germany)

^c MAX PLANCK INSTITUTE FOR POLYMER RESEARCH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ADSORPTION; CRYSTALS; DESORPTION; ELECTROCHEMISTRY; INTERFACES (MATERIALS); QUARTZ; REFRACTIVE INDEX; SURFACE PLASMON RESONANCE;

THIN ORGANIC FILMS;

THIN FILMS;

EID: 0037154496     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la0112716     Document Type: Article

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