160 Gbit/s error-free demultiplexing by ultrafast optical gate monolithically integrating photodiode and electroabsorption modulator

Electronics Letters

Volumn 38, Issue 24, 2002, Pages 1575-1576

  Kodama, S ^a   Yoshimatsu, T ^a   Ito, T ^a   Ishibashi, T ^a  

^a NTT CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

BIT ERROR RATE; LIGHT MODULATORS; MONOLITHIC INTEGRATED CIRCUITS; OPTICAL COMMUNICATION; OPTICAL DEVICES; PHOTODIODES; ULTRAFAST PHENOMENA;

TRAVELLING WAVE ELECTROABSORPTION MODULATOR; ULTRAFAST OPTICAL GATE; UNI TRAVELLING CARRIER PHOTODIODE;

DEMULTIPLEXING;

EID: 0037153536     PISSN: 00135194     EISSN: None     Source Type: Journal    
DOI: 10.1049/el:20021085     Document Type: Article

References (6)

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3. ISHIBASHI, T., SHIMIZU, N., KODAMA, S., ITO, H., NAGATSUMA, T., and FURUTA, T.: 'Uni-Traveling-Carrier Photodiodes'. OSA TOPS on Ultrafast Electronics and Optoelectronics, 1997, Washington, D.C., Sponsored by Optical Society of America, Vol. 13, pp. 83-87 (of OSA Proceedings Series)
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6. KODAMA, S., ITO, T., WATANABE, N., KONDO, S., TAKEUCHI, H., ITO, H., and ISHIBASHI, T.: '200-Gbit/s Monolithic Photodiode-Electroabsorption Modulator (PD-EAM) Optical Gate'. Conference Digest of 59th Annual Device Research Conference, Sponsored by Notre Dame, June 2001, pp. 151-152