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Applied Surface Science

Volumn 194, Issue 1-4, 2002, Pages 234-238

Methods for defect characterisation in thin film materials by depth-selective 2D-ACAR

(5) Eijt, S W H a Falub, C V a Van Veen, A a Schut, H a Mijnarends, P E a

a DELFT UNIVERSITY OF TECHNOLOGY (Netherlands)

Author keywords

Decomposition; Depth profiling; Focusing; Intense positron beam; Positron trapping

Indexed keywords

CRYSTAL DEFECTS; DECOMPOSITION; DOPPLER EFFECT; ION IMPLANTATION; PERMANENT MAGNETS; POSITRON ANNIHILATION SPECTROSCOPY; POSITRONS;

POSITRON TRAPPING;

THIN FILMS;

EID: 0037150986 PISSN: 01694332 EISSN: None Source Type: Journal
DOI: 10.1016/S0169-4332(02)00123-X Document Type: Conference Paper

Times cited : (6)

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- accepted for publication
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- Falub, C.V.¹ Eijt, S.W.H.² Van Veen, A.³ Mijnarends, P.E.⁴ Schut, H.⁵

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