Depth-selective 2D-ACAR with POSH: Application to nanocavities generated by ion implantation

Materials Science Forum

Volumn 363-365, Issue , 2001, Pages 561-563

  Falub, C V ^a   Eijt, S W H ^a   Van Veen, A ^a   Mijnarends, P E ^a   Schut, H ^a  

^a DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

2D ACAR; Ion implantation; Nanocavities; Positronium; Si; Slow position beam

Indexed keywords

HELIUM; ION IMPLANTATION; IRRADIATION; NANOSTRUCTURED MATERIALS; SILICON; SURFACE TREATMENT;

NANOCAVITIES; POSITRON BEAMS; POSITRONIUM;

POSITRON ANNIHILATION SPECTROSCOPY;

EID: 0035010827     PISSN: 02555476     EISSN: 16629752     Source Type: Book Series    
DOI: 10.4028/www.scientific.net/msf.363-365.561     Document Type: Conference Paper

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