Surface analysis of a well-aligned carbon nanotube film by positron-annihilation induced Auger-electron spectroscopy

Applied Surface Science

Volumn 194, Issue 1-4, 2002, Pages 291-295

  Ohdaira, T ^a   Suzuki, R ^a   Kobayashi, Y ^a   Akahane, T ^b   Dai, L ^c  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

^b NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

^c CSIRO   (Australia)

Author keywords

Auger electron spectroscopy; Carbon nanotube; PAES; Positron annihilation

Indexed keywords

ADSORPTION; AUGER ELECTRON SPECTROSCOPY; IMPURITIES; METALLIC FILMS; POSITRON ANNIHILATION SPECTROSCOPY; POSITRONS;

POSITRON ANNIHILATION;

CARBON NANOTUBES;

EID: 0037150972     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(02)00137-X     Document Type: Conference Paper

References (18)