A new model to analyze the effects of noise in a real oscillator

Microwave and Optical Technology Letters

Volumn 32, Issue 4, 2002, Pages 305-307

  Centurelli, Francesco ^a   Ercolani, Alessandro ^a   Tommasino, Pasquale ^a   Trifiletti, Alessandro ^a  

^a SAPIENZA UNIVERSITY OF ROME   (Italy)

Author keywords

Amplitude noise; Behavioral model; Jitter; Phase noise; Voltage controlled oscillator

Indexed keywords

BIT ERROR RATE; COMPUTER SIMULATION; IMPULSE RESPONSE; INVARIANCE; JITTER; PHASE LOCKED LOOPS; RESONATORS; SPURIOUS SIGNAL NOISE; TIME DOMAIN ANALYSIS; TRANSIENTS;

PHASE NOISE; TIME DOMAIN SIMULATIONS;

VARIABLE FREQUENCY OSCILLATORS;

EID: 0037138582     PISSN: 08952477     EISSN: None     Source Type: Journal    
DOI: 10.1002/mop.10161     Document Type: Article

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