VCO jitter simulation and its comparison with measurement

Proceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC

Volumn 1999-January, Issue , 1999, Pages 85-88

  Takahashi, Masayuki ^a   Ogawa, Kimihiro ^a   Kundert, Kenneth S ^b  

^a Sony Corporation Semiconductor Network Company   (Japan)

^b CADENCE DESIGN SYSTEMS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CIRCUIT OSCILLATIONS; CIRCUIT SIMULATION; COMPUTER AIDED DESIGN; OSCILLISTORS; PHASE LOCKED LOOPS; PHASE NOISE; SPECTRAL DENSITY; VARIABLE FREQUENCY OSCILLATORS; WHITE NOISE;

COMPARISON WITH MEASUREMENTS; FLICKER NOISE; FUNCTION OF FREQUENCY; LONG-TERM JITTER; LOW-FREQUENCY; NOISE SOURCE; PERIODIC NOISE; PHASE LOCKED LOOP (PLL);

JITTER;

EID: 6344289891     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ASPDAC.1999.759717     Document Type: Conference Paper

References (8)

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