Electron tunneling and electrochemical currents through interfacial water inside an STM junction

Bulletin of the Korean Chemical Society

Volumn 23, Issue 1, 2002, Pages 71-74

  Song, Moon Bong ^a   Jang, Jai Man ^a   Lee, Chi Woo ^a  

^a Korea University   (South Korea)

Author keywords

Barrier height; Electrochemical current; Electron tunneling; STM

Indexed keywords

WATER;

ARTICLE; ELECTROCHEMISTRY; ELECTRON TRANSPORT; MOISTURE; SCANNING TUNNELING MICROSCOPY; SURFACE PROPERTY;

EID: 0037138224     PISSN: 02532964     EISSN: None     Source Type: Journal    
DOI: 10.5012/bkcs.2002.23.1.071     Document Type: Article

References (19)

1. Wiesendanger, R. Scanning Probe Microscopy and Spectroscopy, Methods and Applications; Cambridge: New York, 1994.
2. Schuster, R.; Barth, J. V.; Wintterlin, J.; Behm, R. J.; Ertl, G. Ultramicroscopy 1992, 42-44, 533.
3. Biscarini, F.; Kenkre, V. M. Surf. Sci. 1999, 426, 336.
4. Olesen, L.; Lægsgaard, E.; Stensgaard, I.; Besenbacher, F.; Schiøtz, J.; Stoltze, P.; Jacobsen, K. W.; Nørskov, J. K. Phys. Rev. Letts. 1994, 72, 2251.
5. Mamin, H. J.; Ganz, E.; Abraham, D. W.; Thomson, R. E.; Clarke, J. Phys. Rev. 1986, B34, 9015.
6. Hong, Y. A.; Hahn, J. R.; Kang, H. J. Chem. Phys. 1998, 108, 4367.
7. Hahn, J. R.; Hong, Y. A.; Kang, H. Appl. Phys. 1998, A66, S467.
8. Fan, F.-R. F.; Bard, A. J. Science 1995, 270, 1849.
9. Heim, M.; Eschrich, R.; Hillebrand, A.; Knapp, H. F.; Guckenberger, R.; Cevc, G. J. Vac. Sci. Technol. 1996, B42, 1498.
10. Schmickler, W. Surf. Sci. 1995, 335, 416.
11. Pan, J.; Jing, T. W.; Lindsay, S. M. J. Phys. Chem. 1994, 98, 4205.
12. Meepagala, S. C.; Real, F. Phys. Rev. 1994, B49, 10761.
13. Guckenberger, R.; Heim, M.; Cevc, G.; Knapp, H. F.; Weigrabe, W.; Hillebrand, A. Science 1994, 266, 1538.
14. Vaught, A.; Jing, T. W.; Lindsay, S. M. Chem. Phys. Letts. 1995, 236, 306.
15. McCarley, R. L.; Hendricks, S. A.; Bard, A. J. J. Phys. Chem. 1992, 96, 10089.
16. Sass, J. K.; Gimzewski, J. K. J. Electroanal. Chem. 1991, 308, 333.
17. Song, M. B.; Jang, J. M.; Bae, S. E.; Lee, C. W. accepted for publication in Langmuir.
18. Lang, N. D. Phys. Rev. 1987, B36, 8173.
19. Ahn, J. H.; Pyo, M. H. Bull. Korean Chem. Soc. 2000, 21, 644.