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Volumn 66, Issue 3-4, 2002, Pages 373-378
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Crystallinity and stoichiometry of InNx films deposited by reactive dc magnetron sputtering
a a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
DEPOSITION;
MAGNETRON SPUTTERING;
METALLIC FILMS;
POLYCRYSTALLINE MATERIALS;
STOICHIOMETRY;
SUBSTRATES;
X RAY DIFFRACTION ANALYSIS;
SODA-LIME GLASSES;
INDIUM COMPOUNDS;
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EID: 0037136213
PISSN: 0042207X
EISSN: None
Source Type: Journal
DOI: 10.1016/S0042-207X(02)00157-4 Document Type: Article |
Times cited : (9)
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References (13)
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