|
Volumn 35, Issue 4 A, 1996, Pages 2261-2265
|
Elemental composition of reactively sputtered indium nitride thin films
|
Author keywords
Elemental composition; InN thin films; RBS; Reactive sputtering; XPS
|
Indexed keywords
ELEMENTAL COMPOSITION;
INDIUM NITRIDE;
INFRARED SPECTROPHOTOMETRY;
REACTIVE SPUTTERING;
COMPOSITION;
CRYSTAL MICROSTRUCTURE;
FILM GROWTH;
FILM PREPARATION;
OXYGEN;
RUTHERFORD BACKSCATTERING SPECTROSCOPY;
SCANNING ELECTRON MICROSCOPY;
SEMICONDUCTING INDIUM COMPOUNDS;
SPECTROPHOTOMETRY;
SPUTTERING;
X RAY DIFFRACTION;
X RAY PHOTOELECTRON SPECTROSCOPY;
THIN FILMS;
|
EID: 0030123685
PISSN: 00214922
EISSN: None
Source Type: Journal
DOI: 10.1143/jjap.35.2261 Document Type: Article |
Times cited : (30)
|
References (10)
|