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An atomic force microscope, where the topographic contrast is caused by force interactions between surface and probe, can also be used for the surface imaging. In our imaging experiments, the resolution of images with atomic force microscopy was generally not as good as that of an STM. In atomic force microscopy, like STM, deformation of the substrate and the monolayer needs to be carefully avoided, expecially as the tip contacts the surface.
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Roughness analyses depend strongly on tip geometry in scanning probe microscopy. To compare the properties of the two substrates, images were acquired at multiple locations of different samples with use of the same tip. Whereas this was accomplished for the bare gold substrates, it was not possible during STM imaging of monolayers because the tip frequently picked up organic contamination from the surface. The consequent effects on resolution and the necessity for different tips added another experimental constraint for analyzing topography of the monolayer-covered surfaces.
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