-
1
-
-
0034429097
-
-
Yamada, T.; Asai, K.; Endo, A.; Zhou, H.S.; Honma, I. J. Mater. Sci. Lett. 2000, 19, 2167.
-
(2000)
J. Mater. Sci. Lett.
, vol.19
, pp. 2167
-
-
Yamada, T.1
Asai, K.2
Endo, A.3
Zhou, H.S.4
Honma, I.5
-
2
-
-
0001128689
-
-
Ogawa, M.; Ishikawa, H.; Kikuchi, T. J. Mater. Chem. 1998, 8, 1783.
-
(1998)
J. Mater. Chem.
, vol.8
, pp. 1783
-
-
Ogawa, M.1
Ishikawa, H.2
Kikuchi, T.3
-
3
-
-
0035857401
-
-
Hernandez, R.; Franville, A.-C.; Minoofar, P.; Dunn, B.; Zink, J.I. J. Am. Chem. Soc. 2001, 123, 1248.
-
(2001)
J. Am. Chem. Soc.
, vol.123
, pp. 1248
-
-
Hernandez, R.1
Franville, A.-C.2
Minoofar, P.3
Dunn, B.4
Zink, J.I.5
-
4
-
-
0033821358
-
-
Grosso, D.; Balkenende, A.R.; Albouy, P.A.; Lavergne, M.; Mazerolles, L.; Babonneau, F. J. Mater. Chem. 2000, 10, 2085.
-
(2000)
J. Mater. Chem.
, vol.10
, pp. 2085
-
-
Grosso, D.1
Balkenende, A.R.2
Albouy, P.A.3
Lavergne, M.4
Mazerolles, L.5
Babonneau, F.6
-
5
-
-
0033366805
-
-
Pevzner, S.; Regev, O.; Yerushalmi-Rozen, R. Curr. Opin. Colloid Interface Sci. 2000, 4, 420.
-
(2000)
Curr. Opin. Colloid Interface Sci.
, vol.4
, pp. 420
-
-
Pevzner, S.1
Regev, O.2
Yerushalmi-Rozen, R.3
-
6
-
-
0033556058
-
-
Ying, J.Y.; Mehnert, C.P.; Wong, M.S. Angew. Chem., Int. Ed. 1999, 38, 56.
-
(1999)
Angew. Chem., Int. Ed.
, vol.38
, pp. 56
-
-
Ying, J.Y.1
Mehnert, C.P.2
Wong, M.S.3
-
7
-
-
2342627791
-
-
Yang, H.; Coombs, N.; Sokolov, I.; Ozin, G.A. J. Mater. Chem. 1997, 7, 1285.
-
(1997)
J. Mater. Chem.
, vol.7
, pp. 1285
-
-
Yang, H.1
Coombs, N.2
Sokolov, I.3
Ozin, G.A.4
-
8
-
-
0034604044
-
-
Fan, H.; Lu, Y.; Stump, A.; Reed, S.T.; Baer, T.; Schunk, R.; Perez-Luna, V.; Lopez, G.P.; Brinker, C.J. Nature, 2000, 405, 56.
-
(2000)
Nature
, vol.405
, pp. 56
-
-
Fan, H.1
Lu, Y.2
Stump, A.3
Reed, S.T.4
Baer, T.5
Schunk, R.6
Perez-Luna, V.7
Lopez, G.P.8
Brinker, C.J.9
-
10
-
-
0034227974
-
-
Markowitz, M.A.; Deng, G.; Gaber, B.P.; Langmuir 2000, 16, 6148.
-
(2000)
Langmuir
, vol.16
, pp. 6148
-
-
Markowitz, M.A.1
Deng, G.2
Gaber, B.P.3
-
11
-
-
0032315584
-
-
Lavin, P.; McDonagh, C.M.; MacCraith, B.D. J. Sol Gel Sci. Technol. 1998, 13, 641.
-
(1998)
J. Sol Gel Sci. Technol.
, vol.13
, pp. 641
-
-
Lavin, P.1
McDonagh, C.M.2
Maccraith, B.D.3
-
12
-
-
0031235808
-
-
Grace K.M.; Shrouf K.; Honkanen S.; Ayras P.; Katila P.; Leppihalme M.; Johnston R.G.; Yang X.; Swanson B.; Peyghambarian, N. Electron. Lett. 1997, 33, 1651.
-
(1997)
Electron. Lett.
, vol.33
, pp. 1651
-
-
Grace, K.M.1
Shrouf, K.2
Honkanen, S.3
Ayras, P.4
Katila, P.5
Leppihalme, M.6
Johnston, R.G.7
Yang, X.8
Swanson, B.9
Peyghambarian, N.10
-
13
-
-
0001355028
-
-
Zhao, D.; Yang, P.; Melosh, N.; Feng, J.; Chmelka, B.F.; Stucky, G.D. Adv. Mater. 1998, 10, 1230.
-
(1998)
Adv. Mater.
, vol.10
, pp. 1230
-
-
Zhao, D.1
Yang, P.2
Melosh, N.3
Feng, J.4
Chmelka, B.F.5
Stucky, G.D.6
-
14
-
-
0034847911
-
-
Grosso, D.; Balkenende, A.R.; Albouy, P.-A.; Ayral, A.; Amenitsch, H.; Babonneau, F. Chem. Mater. 2001, 13, 1848.
-
(2001)
Chem. Mater.
, vol.13
, pp. 1848
-
-
Grosso, D.1
Balkenende, A.R.2
Albouy, P.-A.3
Ayral, A.4
Amenitsch, H.5
Babonneau, F.6
-
15
-
-
0011754025
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-
note
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Although the exact Source of this contamination is not known, we note that the nitrogen content is small in relation to the silicon content and is not evident in the other control samples and therefore is net systemic.
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